Central Laboratory Introduction
Central Laboratory Introduction The central lab  is public test service platform of Sunlord and has a Physical and chemical Lab , a Reliability Test Lab, an Electrical Testing Research Lab, a Simulation Lab and a Pilot Lab. The central lab owns numerous advanced imported test instruments and simulation software which provide structure analysis, material characterization, failure mechanism analysis, electrical specification research, EMC test , magnetism devices simulation, R&D experiments and small-lot production of electronic materials.

The Central Laboratory was formally established in 2011, covering an area of about 5000m2, with equipment assets of more than 100 million yuan. Currently, there are more than 100 professional laboratory personnel, and the expert advisory team mainly composed of product managers, R & D engineers and quality engineers. On the basis of being rooted in Shunluo, the laboratory has carried out extensive and in-depth cooperation with equipment solutions, third-party testing institutions, universities, etc., to provide strong technical support and all-round experimental services for internal and external customers of the company. In September 2016, Sunro Electronics and the world-renowned electronic measurement expert Shiside Technology cooperated to establish the "Sunro Electronics - Shiside Technology Electronic Measurement Joint Laboratory". The joint laboratory mainly conducts test technology research, test platform construction and talent cultivation in the field of electronic measurement based on the demand of CIS. In order to improve the management level and technical capability in the field of detection and analysis, we obtained the national accreditation qualification of CNAS in December 2017.
CNAS Accreditation Test Items List
Laborartoy Accreditation Certificate
Laborartoy
The Physical and
Chemical Analysis
Lab
Electrical Research Lab
Reliability Test Lab
Simulation Lab
Pilot Lab
List of Analysis and Test Services
The Physical and Chemical Lab
Electrical Research Lab
Reliability Test Lab
Simulation Lab
No. Category Equipment Key parameters Test items
1 Microscopic surface observation Integrated scanning electron microscope and energy spectrometer machine Scanning electron microscopy magnification:6X~1,000,000X;
Resolution of energy spectrum analyzer:133eV@MnKɑ.100KCPS;
Range of energy spectrum analysis:B5~U92
Micro area morphology analysis, composition analysis, and micro area size measurement
2 Material characteristic analysis High speed automated specific surface area and porosity analyzer Display Accuracy:0.1%;
Measurement range:孔径:2nm~200nm,specific surface:0.1~3500㎡/g;
Measurement repeatability accuracy:≤±3%
Single/multi-point specific surface area testing, material adsorption desorption isotherms, BJH pore volume distribution/total pore volume/average pore radius
3 X-ray fluorescence analyzer Scope of qualitative analysis of elements:Al13 ~ U92,Controllable RoHS six harmful elements and EN71 eight heavy metal elements;Lower limit of quantification: several ppm to tens of ppm; Analysis time: a few minutes RoHS testing and eight major heavy metal testing for toys
4 X-ray diffractometer Measurement range: 2.5°~160°; Angle accuracy: 0.002° Crystal structure, crystallinity, grain density analysis, phase identification and quantitative analysis
5 cone-and-plate rheometer Torque range: 5~50mNm; Speed range: 0.1~1000RPM; "Qualitative determination of fluid type; Viscosity, yield point testing, and torque variation analysis;False plasticity, thixotropy, and creep testing"
6 Thermal expansion analyzer Temperature range: room temperature~1600 ℃;
Test range: ± 5mm;
Accuracy: 1%;
Heating rate: 0-50K/min
Research on linear expansion and contraction process, determination of expansion coefficient, glass transition temperature, softening point testing; Research on phase transition process and reaction kinetics
7 STA Temperature range: room temperature~1500 ℃,
heating rate: 0~± 99.9 ℃/min or ℃/hour,
Test range: DTA: ± 1~± 1000 μ V; TG: ± 500mg,
Accuracy: Temperature: ± 1.0 ℃; Weighing: ± 1.0%
Study the thermal stability, phase transition, chemical reaction process, melting point determination, adsorption/desorption process, and qualitative analysis of samples.
8 Multiple light scattering instrument Particle size measurement diameter range: 10nm~1000 μM
Scanning interval resolution: 5 μM
Scanning speed: 15mm/s
Number of detectors: 2
Light source wavelength: 880nm ± 20nm
Measurement temperature range: 4 ℃~80 ℃
Number of samples to accommodate: 6
Sample tube volume: 20mL
Particle size testing of slurry or powder, characterization of slurry dispersion, and characterization of slurry stability
9 Moisture analyzer Measurement range: 10 μ G~100mg H2O
Titration rate: maximum 2.5mg/min
Moisture content test
10 Failure analysis X-ray testing machine Feature resolution:<1µm;
Geometric magnification: maximum 2000X;
Overall magnification: maximum 10000X
X-ray fluoroscopy analysis/CT tomography analysis
11 Fully automatic disc grinding machine Turning speed: 50-150 rpm, adjustable;
Rotation direction: clockwise, counterclockwise.
Rotating speed of the turntable is 40-600rpm;
Rotation direction: counterclockwise. Polishing 54 dBA, grinding 56 Dba
Slice analysis
12 Ultrasonic scanning microscope "Scanning modes: A-Scan (point scan), B-Scan (cross-sectional scan),
C-Scan (layer scan), Q-BAM (multi-layer cross-sectional scan), Tray Scan (tray scan), multi-layer C-scan
Scanning range: 510 x 510 mm
Scanning speed: 0~1000 mm/s
Scanning frequency: 15 MHz, 30 MHz, 75 MHz, 120 MHz
Scanning resolution: The scanning resolution in the X/Y direction is ± 0.1 µ m, and the defect sensitivity in the Z direction can reach ± 5nm.
Minimum threshold time: 1 ns"
Non destructive testing analysis of internal cracks, holes, delamination and other defects in devices or raw materials
13 Thermal emission microscope Detection wavelength range: 7-14um
Detector resolution: 640 * 480
Lens resolution: 5-180 μM
Temperature control: 20-80 ℃
Maximum input voltage: 200V Maximum input current: 1.5A
Data output modes: transient phase-locked diagram, peak amplitude diagram, peak phase diagram, valley amplitude diagram, valley phase diagram, voltage/current monitoring, IV curve testing, Lock In phase-locked analysis
Hotspot analysis, searching for internal short circuit points in devices
14 Ion grinding and polishing machine Acceleration voltage: 1-10kV
Test temperature range: -80 ℃ - room temperature
Mode selection: Flat grinding/Section cutting
Plane grinding angle range: 0-10 °
Ion grinding polishing
Test Flowchart
Start
Application Form
Submitting
Customer
Test Quoting
Lab's Customer
Services
Quotation Confiming
and Sample
DeliveringN
Customer
Test Plan
Preparing
Lab's Customer
Service
Testing
Central Lab
Bank Slip
Providing
Customer
Report Delivering
and Sample
Retuming
Lab's Customer
Services
End
CNAS Accreditation Test Items List
Laborartoy Accreditation Certificate