| No. | Category | Equipment | Key parameters | Test items | 
|---|---|---|---|---|
| 1 | Microscopic surface observation | Integrated scanning electron microscope and energy spectrometer machine | Scanning electron microscopy magnification:6X~1,000,000X; Resolution of energy spectrum analyzer:133eV@MnKɑ.100KCPS; Range of energy spectrum analysis:B5~U92  | 
                                Micro area morphology analysis, composition analysis, and micro area size measurement | 
| 2 | Material characteristic analysis | High speed automated specific surface area and porosity analyzer | Display Accuracy:0.1%; Measurement range:孔径:2nm~200nm,specific surface:0.1~3500㎡/g; Measurement repeatability accuracy:≤±3%  | 
                                Single/multi-point specific surface area testing, material adsorption desorption isotherms, BJH pore volume distribution/total pore volume/average pore radius | 
| 3 | X-ray fluorescence analyzer | Scope of qualitative analysis of elements:Al13 ~ U92,Controllable RoHS six harmful elements and EN71 eight heavy metal elements;Lower limit of quantification: several ppm to tens of ppm; Analysis time: a few minutes | RoHS testing and eight major heavy metal testing for toys | |
| 4 | X-ray diffractometer | Measurement range: 2.5°~160°; Angle accuracy: 0.002° | Crystal structure, crystallinity, grain density analysis, phase identification and quantitative analysis | |
| 5 | cone-and-plate rheometer | Torque range: 5~50mNm; Speed range: 0.1~1000RPM; | "Qualitative determination of fluid type; Viscosity, yield point testing, and torque variation analysis;False plasticity, thixotropy, and creep testing" | |
| 6 | Thermal expansion analyzer | Temperature range: room temperature~1600 ℃; Test range: ± 5mm; Accuracy: 1%; Heating rate: 0-50K/min  | 
                                Research on linear expansion and contraction process, determination of expansion coefficient, glass transition temperature, softening point testing; Research on phase transition process and reaction kinetics | |
| 7 | STA | Temperature range: room temperature~1500 ℃, heating rate: 0~± 99.9 ℃/min or ℃/hour, Test range: DTA: ± 1~± 1000 μ V; TG: ± 500mg, Accuracy: Temperature: ± 1.0 ℃; Weighing: ± 1.0%  | 
                                Study the thermal stability, phase transition, chemical reaction process, melting point determination, adsorption/desorption process, and qualitative analysis of samples. | |
| 8 | Multiple light scattering instrument | Particle size measurement diameter range: 10nm~1000 μM Scanning interval resolution: 5 μM Scanning speed: 15mm/s Number of detectors: 2 Light source wavelength: 880nm ± 20nm Measurement temperature range: 4 ℃~80 ℃ Number of samples to accommodate: 6 Sample tube volume: 20mL  | 
                                Particle size testing of slurry or powder, characterization of slurry dispersion, and characterization of slurry stability | |
| 9 | Moisture analyzer | Measurement range: 10 μ G~100mg H2O Titration rate: maximum 2.5mg/min  | 
                                Moisture content test | |
| 10 | Failure analysis | X-ray testing machine | Feature resolution:<1µm; Geometric magnification: maximum 2000X; Overall magnification: maximum 10000X  | 
                                X-ray fluoroscopy analysis/CT tomography analysis | 
| 11 | Fully automatic disc grinding machine | Turning speed: 50-150 rpm, adjustable; Rotation direction: clockwise, counterclockwise. Rotating speed of the turntable is 40-600rpm; Rotation direction: counterclockwise. Polishing 54 dBA, grinding 56 Dba  | 
                                Slice analysis | |
| 12 | Ultrasonic scanning microscope | "Scanning modes: A-Scan (point scan), B-Scan (cross-sectional scan),  C-Scan (layer scan), Q-BAM (multi-layer cross-sectional scan), Tray Scan (tray scan), multi-layer C-scan Scanning range: 510 x 510 mm Scanning speed: 0~1000 mm/s Scanning frequency: 15 MHz, 30 MHz, 75 MHz, 120 MHz Scanning resolution: The scanning resolution in the X/Y direction is ± 0.1 µ m, and the defect sensitivity in the Z direction can reach ± 5nm. Minimum threshold time: 1 ns"  | 
                                Non destructive testing analysis of internal cracks, holes, delamination and other defects in devices or raw materials | |
| 13 | Thermal emission microscope | Detection wavelength range: 7-14um Detector resolution: 640 * 480 Lens resolution: 5-180 μM Temperature control: 20-80 ℃ Maximum input voltage: 200V Maximum input current: 1.5A Data output modes: transient phase-locked diagram, peak amplitude diagram, peak phase diagram, valley amplitude diagram, valley phase diagram, voltage/current monitoring, IV curve testing, Lock In phase-locked analysis  | 
                                Hotspot analysis, searching for internal short circuit points in devices | |
| 14 | Ion grinding and polishing machine | Acceleration voltage: 1-10kV Test temperature range: -80 ℃ - room temperature Mode selection: Flat grinding/Section cutting Plane grinding angle range: 0-10 °  | 
                                Ion grinding polishing | 
            
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