Whisker is a kind of spontaneous columnar or cylindrical filament, usually of mono-crystalline metal, emanating from the surface of a finished product. Sn whiskers have been an industrial concern and interesting problem for many years.
They are known to cause short circuits or possible reliability degradation in fine-pitch pre-tinned electrical components. Sn whiskers grow by the addition of material at their base not at their tip (i.e., they grow out of the substrate).
They can grow from as-formed electrodeposits, vapor deposited material, and intentionally deformed coatings of Sn. Similar whiskers are observed in Cd, In, and Zn. Whiskers appear to be a local response to the existence of residual stress. Compressive residual or external stress is usually considered a precondition for whisker growth.
Annealing or melting (reflow in solder terminology) may mitigate the growth for an undetermined period of time. Control methods of mitigation Sn whisker growth provided by Sunlord:
1) to select sulfonate plating liquid producing lowest compressive stress,
2) to select non-bright plating system to decrease compositions and contents of organic additives,
3) to manage and control thickness of nickel, under-layer of Sn,
4) to optimize plating process parameters to improve density and uniformity of Sn layers.













